Microscopy method unlocks 'materials genome,' opening possibilities for next-generation design

Researchers at the University of Sydney have developed a new microscopy method using atom probe tomography (APT) to analyze short-range order (SRO) in crystalline materials at the atomic level. This technique allows for detailed observation of atomic arrangements, crucial for developing advanced materials such as stronger alloys and semiconductors. The study reveals how different heat treatments affect SRO in high entropy alloys, offering a path to custom-designed materials with enhanced properties for aerospace, electronics, and other industries.

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