Team presents new path to long-term data storage based on atomic-scale defects

This article introduces a novel concept for long-term data storage proposed by an international research team led by the HZDR, using atomic-scale defects in silicon carbide created by a focused ion beam. This method boasts high spatial resolution, rapid writing speeds, and low energy consumption per bit stored, offering a sustainable solution to the data explosion and the limitations of current storage media. The approach utilizes photoluminescence for data readout, promising significantly enhanced storage densities and minimal environmental impact compared to existing technologies. For more details, you can read the full article on